VIP Ultra

The VIP Ultra by Cosmic is a new-generation, high-throughput ATE (Automatic Test Equipment) configurable for high- and low-side driver ICs, IGBTs, Power MOSFETs, and DC wafer testing of Si, SiC, and GaN power products. Designed for power semiconductor production, VIP Ultra combines ultra-high throughput, low total cost of ownership, and minimum footprint in a flexible platform scalable across different voltage and technology requirements.

The platform is available in multiple configurations: VIP Ultra 80V, supporting up to 48 test sites at 80 V @ 250 A; VIP Ultra 1.7kV, with 32 sites and up to 1.7 kV @ 120 mA plus 80 V @ 250 A; VIP Ultra 3kV, with 16 sites and up to 3 kV @ 120 mA plus 80 V @ 250 A; and a dedicated VIP Ultra GaN configuration with 16 sites, 1.7 kV @ 120 mA and 80 V @ 250 A.

VIP Ultra integrates up to 320 digital channels and 64 PPMUs, floating digital drivers, high-current programmable sink/source capability, LCR measurement, and high-sensitivity picoammeter measurement with accuracy down to ±20 pA. Test capabilities include Rg + Cgs characterization and UIS testing, while dynamic RDS(on) is specifically supported by the GaN configuration.

With a compact footprint, VIP Ultra is designed to maximize test density while supporting the evolving requirements of Si, SiC, and GaN power semiconductor production.